КФУ. Карточка публикации. Test program generation for mixed-signal integrated circuits based on automata network

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TEST PROGRAM GENERATION FOR MIXED-SIGNAL INTEGRATED CIRCUITS BASED ON AUTOMATA NETWORK

Форма представления

Статьи в зарубежных журналах и сборниках

Год публикации

2015

Язык

английский

Авторы, сотрудники КФУ

Мосин Сергей Геннадьевич, автор

Библиографическое описание на языке оригинала

Mosin, S. Test program generation for mixed-signal integrated circuits based on automata network [Text] / S. G. Mosin // Proc. of IEEE East-West Design and Test Symposium (EWDTS?2015). – Batumi, Georgia, 2015. – P. 76-81.

Аннотация

Proc. of IEEE East-West Design and Test Symposium (EWDTS?2015)

Ключевые слова

automata theory, automata network, automated test program generation,hierarchical testing, mixed-signal integrated circuits, design-for-testability

Название журнала

Proc. of IEEE East-West Design and Test Symposium (EWDTS?2015)

URL

http://dx.doi.org/10.1109/EWDTS.2015.7493152

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https://repository.kpfu.ru/?p_id=135487

Полная запись метаданных

Поле DC	Значение	Язык
dc.contributor.author	Мосин Сергей Геннадьевич	ru_RU
dc.date.accessioned	2015-01-01T00:00:00Z	ru_RU
dc.date.available	2015-01-01T00:00:00Z	ru_RU
dc.date.issued	2015	ru_RU
dc.identifier.citation	Mosin, S. Test program generation for mixed-signal integrated circuits based on automata network [Text] / S. G. Mosin // Proc. of IEEE East-West Design and Test Symposium (EWDTS?2015). – Batumi, Georgia, 2015. – P. 76-81.	ru_RU
dc.identifier.uri	https://repository.kpfu.ru/?p_id=135487	ru_RU
dc.description.abstract	Proc. of IEEE East-West Design and Test Symposium (EWDTS?2015)	ru_RU
dc.description.abstract	Testing and diagnosis of mixed-signal integrated circuits are very important and complex tasks, which require selection the most relevant test methods for analog and digital subcircuits and subsequent their matching for comprehensive testing of a circuit on the whole. Two basic models for description the test process of mixed-signal IC based on the algebraic automata theory are proposed. The method of test program generation for mixed-signal IC in the form of automata network is presented in the paper. Generated test programs take into account the features of CUT and used test equipment and also ensure matching of applied test methods for hierarchical testing of mixed-signal IC. The method provides the feasibility to the automated test program generation for mixed-signal IC testing with various resolving ability using the state-of-the-art ATE. Experimental results of the method application for the mixed-signal circuit are presented.	ru_RU
dc.language.iso	ru	ru_RU
dc.subject	automata theory	ru_RU
dc.subject	automata network	ru_RU
dc.subject	automated test program generation	ru_RU
dc.subject	hierarchical testing	ru_RU
dc.subject	mixed-signal integrated circuits	ru_RU
dc.subject	design-for-testability	ru_RU
dc.title	Test program generation for mixed-signal integrated circuits based on automata network	ru_RU
dc.type	Статьи в зарубежных журналах и сборниках	ru_RU