КФУ. Карточка публикации. On uniqueness of a solution to the problem of reconstruction of the homogeneous dielectric layer parameters

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ON UNIQUENESS OF A SOLUTION TO THE PROBLEM OF RECONSTRUCTION OF THE HOMOGENEOUS DIELECTRIC LAYER PARAMETERS

Форма представления

Статьи в зарубежных журналах и сборниках

Год публикации

2017

Язык

английский

Авторы, сотрудники КФУ

Тумаков Дмитрий Николаевич, автор

Библиографическое описание на языке оригинала

Tumakov D. On uniqueness of a solution to the problem of reconstruction of the homogeneous dielectric layer parameters // Far East Journal of Mathematical Sciences. – 2017. – Vol. 101, No. 4. – P. 763-772.

Аннотация

Uniqueness of a solution to the problem of reconstruction of the dielectric layer parameters arising during analysis of a scattered field is investigated. The study is concerned with two cases, which include determining refractive index of a dielectric material, filling the layer, and determining thickness of the layer. It is concluded that two measurements, conducted at different and «properly chosen« frequencies, are sufficient to provide uniqueness of a solution to the reconstruction problem.

Ключевые слова

reconstruction of parameters, uniqueness of solution, dielectric layer, inverse problem

Название журнала

Far East Journal of Mathematical Sciences

URL

http://www.pphmj.com/abstract/10542.htm

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https://repository.kpfu.ru/?p_id=152267

Полная запись метаданных

Поле DC	Значение	Язык
dc.contributor.author	Тумаков Дмитрий Николаевич	ru_RU
dc.date.accessioned	2017-01-01T00:00:00Z	ru_RU
dc.date.available	2017-01-01T00:00:00Z	ru_RU
dc.date.issued	2017	ru_RU
dc.identifier.citation	Tumakov D. On uniqueness of a solution to the problem of reconstruction of the homogeneous dielectric layer parameters // Far East Journal of Mathematical Sciences. – 2017. – Vol. 101, No. 4. – P. 763-772.	ru_RU
dc.identifier.uri	https://repository.kpfu.ru/?p_id=152267	ru_RU
dc.description.abstract	Far East Journal of Mathematical Sciences	ru_RU
dc.description.abstract	Uniqueness of a solution to the problem of reconstruction of the dielectric layer parameters arising during analysis of a scattered field is investigated. The study is concerned with two cases, which include determining refractive index of a dielectric material, filling the layer, and determining thickness of the layer. It is concluded that two measurements, conducted at different and «properly chosen« frequencies, are sufficient to provide uniqueness of a solution to the reconstruction problem.	ru_RU
dc.language.iso	ru	ru_RU
dc.subject	reconstruction of parameters	ru_RU
dc.subject	uniqueness of solution	ru_RU
dc.subject	dielectric layer	ru_RU
dc.subject	inverse problem	ru_RU
dc.title	On uniqueness of a solution to the problem of reconstruction of the homogeneous dielectric layer parameters	ru_RU
dc.type	Статьи в зарубежных журналах и сборниках	ru_RU