КФУ. Карточка публикации. An approach to design-for-testability automation of analogue integrated circuits using OBIST strategy

КАЗАНСКИЙ
ФЕДЕРАЛЬНЫЙ УНИВЕРСИТЕТ

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AN APPROACH TO DESIGN-FOR-TESTABILITY AUTOMATION OF ANALOGUE INTEGRATED CIRCUITS USING OBIST STRATEGY

Форма представления

Статьи в зарубежных журналах и сборниках

Год публикации

2016

Язык

английский

Авторы, сотрудники КФУ

Мосин Сергей Геннадьевич, автор

Библиографическое описание на языке оригинала

Mosin S., An approach to design-for-testability automation of analogue integrated circuits using OBIST strategy//2016 5th Mediterranean Conference on Embedded Computing, MECO 2016 - Including ECyPS 2016, BIOENG.MED 2016, MECO: Student Challenge 2016. - 2016. - Vol., Is.. - P.211-214.

Аннотация

The reasons of application OBIST concept for testing analog integrated circuits are given. Design automation of OBIST circuitries is important step for their efficient development. The approach to design automation of OBIST-based test circuitries is presented. The structural solutions for circuit recon-figuration to oscillator are proposed. The criterion of the reconfiguration circuitry selection for OBIST and rules of reconfiguration for proposed structural solutions are described.

Ключевые слова

DFT, OBIST, CAD, analog testing, reconfiguration

Название журнала

2016 5th Mediterranean Conference on Embedded Computing, MECO 2016 - Including ECyPS 2016, BIOENG.MED 2016, MECO: Student Challenge 2016

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84994102640&partnerID=40&md5=c242688ded62eef4a97ea40c5aeac0d4

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https://repository.kpfu.ru/?p_id=165138

Полная запись метаданных

Поле DC	Значение	Язык
dc.contributor.author	Мосин Сергей Геннадьевич	ru_RU
dc.date.accessioned	2016-01-01T00:00:00Z	ru_RU
dc.date.available	2016-01-01T00:00:00Z	ru_RU
dc.date.issued	2016	ru_RU
dc.identifier.citation	Mosin S., An approach to design-for-testability automation of analogue integrated circuits using OBIST strategy//2016 5th Mediterranean Conference on Embedded Computing, MECO 2016 - Including ECyPS 2016, BIOENG.MED 2016, MECO: Student Challenge 2016. - 2016. - Vol., Is.. - P.211-214.	ru_RU
dc.identifier.uri	https://repository.kpfu.ru/?p_id=165138	ru_RU
dc.description.abstract	2016 5th Mediterranean Conference on Embedded Computing, MECO 2016 - Including ECyPS 2016, BIOENG.MED 2016, MECO: Student Challenge 2016	ru_RU
dc.description.abstract	The reasons of application OBIST concept for testing analog integrated circuits are given. Design automation of OBIST circuitries is important step for their efficient development. The approach to design automation of OBIST-based test circuitries is presented. The structural solutions for circuit recon-figuration to oscillator are proposed. The criterion of the reconfiguration circuitry selection for OBIST and rules of reconfiguration for proposed structural solutions are described.	ru_RU
dc.language.iso	ru	ru_RU
dc.subject	DFT	ru_RU
dc.subject	OBIST	ru_RU
dc.subject	CAD	ru_RU
dc.subject	analog testing	ru_RU
dc.subject	reconfiguration	ru_RU
dc.title	An approach to design-for-testability automation of analogue integrated circuits using OBIST strategy	ru_RU
dc.type	Статьи в зарубежных журналах и сборниках	ru_RU