КФУ. Карточка публикации. Estimation of parameters of charge carriers in dielectric materials by CELIV method

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ESTIMATION OF PARAMETERS OF CHARGE CARRIERS IN DIELECTRIC MATERIALS BY CELIV METHOD

Форма представления

Статьи в зарубежных журналах и сборниках

Год публикации

2017

Язык

английский

Авторы, сотрудники КФУ

Савельева Татьяна Николаевна, автор

Хафизов Ильдар Ильсурович, автор

Библиографическое описание на языке оригинала

Khafizov I.I, Saveleva T.N, Lyubtsov V.S., Estimation of parameters of charge carriers in dielectric materials by CELIV method//IOP Conference Series: Materials Science and Engineering. - 2017. - Vol.240, Is.1. - Art. № 012040.

Аннотация

Measuring the mobility of charge carriers by the time-of-flight method has been used for several decades to study organic semiconductors and dielectrics. Modern research in the field of polymer semiconductor devices focuses on the properties of single- and multi-layer thin-film structures with thicknesses less than 100 nm. Such structures are of considerable interest for research, since they are the basis for organic light-emitting diodes, organic solar cells and other electronic devices.

Ключевые слова

time-of-flight method

Название журнала

IOP Conference Series: Materials Science and Engineering

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-85034069338&doi=10.1088%2f1757-899X%2f240%2f1%2f012040&partnerID=40&md5=c89ab66ee71b153cf85f962759a3d226

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https://repository.kpfu.ru/?p_id=169630

Файлы ресурса

Название файла	Размер (Мб)	Формат
F_Khafizov_2017_IOP_Conf._Ser.__Mater._Sci._Eng._240_012040.pdf	0,32	pdf	посмотреть / скачать

Полная запись метаданных

Поле DC	Значение	Язык
dc.contributor.author	Савельева Татьяна Николаевна	ru_RU
dc.contributor.author	Хафизов Ильдар Ильсурович	ru_RU
dc.date.accessioned	2017-01-01T00:00:00Z	ru_RU
dc.date.available	2017-01-01T00:00:00Z	ru_RU
dc.date.issued	2017	ru_RU
dc.identifier.citation	Khafizov I.I, Saveleva T.N, Lyubtsov V.S., Estimation of parameters of charge carriers in dielectric materials by CELIV method//IOP Conference Series: Materials Science and Engineering. - 2017. - Vol.240, Is.1. - Art. № 012040.	ru_RU
dc.identifier.uri	https://repository.kpfu.ru/?p_id=169630	ru_RU
dc.description.abstract	IOP Conference Series: Materials Science and Engineering	ru_RU
dc.description.abstract	Measuring the mobility of charge carriers by the time-of-flight method has been used for several decades to study organic semiconductors and dielectrics. Modern research in the field of polymer semiconductor devices focuses on the properties of single- and multi-layer thin-film structures with thicknesses less than 100 nm. Such structures are of considerable interest for research, since they are the basis for organic light-emitting diodes, organic solar cells and other electronic devices.	ru_RU
dc.language.iso	ru	ru_RU
dc.subject		ru_RU
dc.title	Estimation of parameters of charge carriers in dielectric materials by CELIV method	ru_RU
dc.type	Статьи в зарубежных журналах и сборниках	ru_RU