Казанский (Приволжский) федеральный университет, КФУ
КАЗАНСКИЙ
ФЕДЕРАЛЬНЫЙ УНИВЕРСИТЕТ
 
AUTOMATED TESTING OF FUNCTIONAL REQUIREMENTS FOR VIRTUAL REALITY APPLICATIONS
Форма представленияСтатьи в зарубежных журналах и сборниках
Год публикации2023
Языканглийский
  • Кугуракова Влада Владимировна, автор
  • Хафизов Мурад Рустэмович, автор
  • Кирайева Руфина Радиковна, автор
  • Библиографическое описание на языке оригинала Kirayeva R.R, Turdiev T.T, Khafizov M.R, Automated Testing of Functional Requirements for Virtual Reality Applications//Proceedings of the 2023 IEEE 16th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2023. 2023. P.1760-1764.
    Аннотация As the virtual reality (VR) application landscape continues to expand exponentially, the software industry faces an increasingly critical need for advanced tools to ensure the quality of these applications. This paper meticulously assesses the strengths and weaknesses of existing solutions designed for the automated testing of VR applications. It introduces an innovative approach that combines traditional test coverage parameters, including GUI, API, performance requirements, load requirements, and user scenarios, with a specialized focus on usability testing. This usability testing involves simulating real-world interactions within a VR application using commonly available VR input devices. Notably, the paper outlines the development of a program rooted in this methodology, significantly enhancing the testing process by eliminating the requirement for a VR headset. Instead, standard input devices such as a keyboard and mouse are utilized as controllers, providing a practical and comprehensive means of ensuring the quality and functionality of VR applications in a rapidly evolving industry.
    Ключевые слова virtual reality, VR, testing, functional testing, functional requirements
    Название журнала Proceedings of the 2023 IEEE 16th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2023
    URL https://www.scopus.com/inward/record.uri?eid=2-s2.0-85182262991&doi=10.1109%2fAPEIE59731.2023.10347611&partnerID=40&md5=2633a71f980d5392cfd19be5a4599906
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