KFU. Card publication. A Built-in Self-Test Circuitry Based on Reconfiguration for Analog and Mixed-Signal IC

KAZAN
FEDERAL UNIVERSITY

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A BUILT-IN SELF-TEST CIRCUITRY BASED ON RECONFIGURATION FOR ANALOG AND MIXED-SIGNAL IC

Form of presentation

Articles in international journals and collections

Year of publication

2011

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Authors, employees of KFU

Mosin Sergey Gennadevich, author

Bibliographic description in the original language

Mosin, S. A Built-in Self-Test Circuitry Based on Reconfiguration for Analog and Mixed-Signal IC, Information Technology and Control. – 2011. Vol.40. No. 3. – P. 260 – 264. – ISSN 1392 – 124X

Keywords

BIST, DFT, mixed-signal integrated circuits

The name of the journal

Information Technology and Control

URL

http://dx.doi.org/10.5755/j01.itc.40.3.635

Please use this ID to quote from or refer to the card

https://repository.kpfu.ru/eng/?p_id=125501&p_lang=2

Full metadata record

Field DC	Value	Language
dc.contributor.author	Mosin Sergey Gennadevich	ru_RU
dc.date.accessioned	2011-01-01T00:00:00Z	ru_RU
dc.date.available	2011-01-01T00:00:00Z	ru_RU
dc.date.issued	2011	ru_RU
dc.identifier.citation	Mosin, S. A Built-in Self-Test Circuitry Based on Reconfiguration for Analog and Mixed-Signal IC, Information Technology and Control. – 2011. Vol.40. No. 3. – P. 260 – 264. – ISSN 1392 – 124X	ru_RU
dc.identifier.uri	https://repository.kpfu.ru/eng/?p_id=125501&p_lang=2	ru_RU
dc.description.abstract	Information Technology and Control	ru_RU
dc.language.iso	ru	ru_RU
dc.subject	BIST	ru_RU
dc.subject	DFT	ru_RU
dc.subject	mixed-signal integrated circuits	ru_RU
dc.title	A Built-in Self-Test Circuitry Based on Reconfiguration for Analog and Mixed-Signal IC	ru_RU
dc.type	Articles in international journals and collections	ru_RU