KFU. Card publication. Test program generation for mixed-signal integrated circuits based on automata network

KAZAN
FEDERAL UNIVERSITY

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- 中文
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TEST PROGRAM GENERATION FOR MIXED-SIGNAL INTEGRATED CIRCUITS BASED ON AUTOMATA NETWORK

Form of presentation

Articles in international journals and collections

Year of publication

2015

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Authors, employees of KFU

Mosin Sergey Gennadevich, author

Bibliographic description in the original language

Mosin, S. Test program generation for mixed-signal integrated circuits based on automata network [Text] / S. G. Mosin // Proc. of IEEE East-West Design and Test Symposium (EWDTS?2015). – Batumi, Georgia, 2015. – P. 76-81.

Annotation

Proc. of IEEE East-West Design and Test Symposium (EWDTS?2015)

Keywords

automata theory, automata network, automated test program generation,hierarchical testing, mixed-signal integrated circuits, design-for-testability

The name of the journal

Proc. of IEEE East-West Design and Test Symposium (EWDTS?2015)

URL

http://dx.doi.org/10.1109/EWDTS.2015.7493152

Please use this ID to quote from or refer to the card

https://repository.kpfu.ru/eng/?p_id=135487&p_lang=2

Full metadata record

Field DC	Value	Language
dc.contributor.author	Mosin Sergey Gennadevich	ru_RU
dc.date.accessioned	2015-01-01T00:00:00Z	ru_RU
dc.date.available	2015-01-01T00:00:00Z	ru_RU
dc.date.issued	2015	ru_RU
dc.identifier.citation	Mosin, S. Test program generation for mixed-signal integrated circuits based on automata network [Text] / S. G. Mosin // Proc. of IEEE East-West Design and Test Symposium (EWDTS?2015). – Batumi, Georgia, 2015. – P. 76-81.	ru_RU
dc.identifier.uri	https://repository.kpfu.ru/eng/?p_id=135487&p_lang=2	ru_RU
dc.description.abstract	Proc. of IEEE East-West Design and Test Symposium (EWDTS?2015)	ru_RU
dc.description.abstract	Testing and diagnosis of mixed-signal integrated circuits are very important and complex tasks, which require selection the most relevant test methods for analog and digital subcircuits and subsequent their matching for comprehensive testing of a circuit on the whole. Two basic models for description the test process of mixed-signal IC based on the algebraic automata theory are proposed. The method of test program generation for mixed-signal IC in the form of automata network is presented in the paper. Generated test programs take into account the features of CUT and used test equipment and also ensure matching of applied test methods for hierarchical testing of mixed-signal IC. The method provides the feasibility to the automated test program generation for mixed-signal IC testing with various resolving ability using the state-of-the-art ATE. Experimental results of the method application for the mixed-signal circuit are presented.	ru_RU
dc.language.iso	ru	ru_RU
dc.subject	automata theory	ru_RU
dc.subject	automata network	ru_RU
dc.subject	automated test program generation	ru_RU
dc.subject	hierarchical testing	ru_RU
dc.subject	mixed-signal integrated circuits	ru_RU
dc.subject	design-for-testability	ru_RU
dc.title	Test program generation for mixed-signal integrated circuits based on automata network	ru_RU
dc.type	Articles in international journals and collections	ru_RU