KFU. Card publication. Estimation of parameters of charge carriers in dielectric materials by CELIV method

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FEDERAL UNIVERSITY

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ESTIMATION OF PARAMETERS OF CHARGE CARRIERS IN DIELECTRIC MATERIALS BY CELIV METHOD

Form of presentation

Articles in international journals and collections

Year of publication

2017

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Authors, employees of KFU

Saveleva Tatyana Nikolaevna, author

Khafizov Ildar Ilsurovich, author

Bibliographic description in the original language

Khafizov I.I, Saveleva T.N, Lyubtsov V.S., Estimation of parameters of charge carriers in dielectric materials by CELIV method//IOP Conference Series: Materials Science and Engineering. - 2017. - Vol.240, Is.1. - Art. � 012040.

Annotation

Measuring the mobility of charge carriers by the time-of-flight method has been used for several decades to study organic semiconductors and dielectrics. Modern research in the field of polymer semiconductor devices focuses on the properties of single- and multi-layer thin-film structures with thicknesses less than 100 nm. Such structures are of considerable interest for research, since they are the basis for organic light-emitting diodes, organic solar cells and other electronic devices.

Keywords

time-of-flight method

The name of the journal

IOP Conference Series: Materials Science and Engineering

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-85034069338&doi=10.1088%2f1757-899X%2f240%2f1%2f012040&partnerID=40&md5=c89ab66ee71b153cf85f962759a3d226

Please use this ID to quote from or refer to the card

https://repository.kpfu.ru/eng/?p_id=169630&p_lang=2

Resource files

File name	Size (MB)	Format
F_Khafizov_2017_IOP_Conf._Ser.__Mater._Sci._Eng._240_012040.pdf	0,32	pdf	show / download

Full metadata record

Field DC	Value	Language
dc.contributor.author	Saveleva Tatyana Nikolaevna	ru_RU
dc.contributor.author	Khafizov Ildar Ilsurovich	ru_RU
dc.date.accessioned	2017-01-01T00:00:00Z	ru_RU
dc.date.available	2017-01-01T00:00:00Z	ru_RU
dc.date.issued	2017	ru_RU
dc.identifier.citation	Khafizov I.I, Saveleva T.N, Lyubtsov V.S., Estimation of parameters of charge carriers in dielectric materials by CELIV method//IOP Conference Series: Materials Science and Engineering. - 2017. - Vol.240, Is.1. - Art. � 012040.	ru_RU
dc.identifier.uri	https://repository.kpfu.ru/eng/?p_id=169630&p_lang=2	ru_RU
dc.description.abstract	IOP Conference Series: Materials Science and Engineering	ru_RU
dc.description.abstract	Measuring the mobility of charge carriers by the time-of-flight method has been used for several decades to study organic semiconductors and dielectrics. Modern research in the field of polymer semiconductor devices focuses on the properties of single- and multi-layer thin-film structures with thicknesses less than 100 nm. Such structures are of considerable interest for research, since they are the basis for organic light-emitting diodes, organic solar cells and other electronic devices.	ru_RU
dc.language.iso	ru	ru_RU
dc.subject		ru_RU
dc.title	Estimation of parameters of charge carriers in dielectric materials by CELIV method	ru_RU
dc.type	Articles in international journals and collections	ru_RU