Form of presentation | Articles in Russian journals and collections |
Year of publication | 2017 |
Язык | английский |
|
Vakhitov Iskander Rashidovich, author
Gumarov Amir Ildusovich, author
Kiyamov Ayrat Gazinurovich, author
Nikitin Sergey Ivanovich, author
Tagirov Lenar Rafgatovich, author
Kharincev Sergey Sergeevich, author
Yusupov Roman Valerevich, author
Yanilkin Igor Vitalevich, author
|
Bibliographic description in the original language |
Mohammed W. M. et al. Electrical properties of titanium nitride films synthesized by reactive magnetron sputtering //Journal of Physics: Conference Series. – IOP Publishing, 2017. – T. 927. – №. 1. – S. 012036. |
Annotation |
Reactive dc magnetron sputtering was employed to produce thin films of titanium nitride using titanium metallic target, argon as the plasma gas and nitrogen as the reactive gas. A set of the films was studied deposited on the Si, fused silica and crystalline (001) MgO substrates with various deposition conditions. The films deposited on the Si and SiO2 substrates are polycrystalline while deposited at slow rate to the heated to 600C MgO substrate are highly epitaxial according both to XRD and LEED data. Electrical resistivity of the films was measured by means of the four-probe van der Pauw method. |
Keywords |
Deposition conditions,metallic targets, MgO substrate, polycrystalline, reactive DC magnetron sputtering, reactive magnetron sputtering, titanium nitride films, Van der Pauw method |
The name of the journal |
Journal of Physics: Conference Series
|
Please use this ID to quote from or refer to the card |
https://repository.kpfu.ru/eng/?p_id=173295&p_lang=2 |
Full metadata record |
Field DC |
Value |
Language |
dc.contributor.author |
Vakhitov Iskander Rashidovich |
ru_RU |
dc.contributor.author |
Gumarov Amir Ildusovich |
ru_RU |
dc.contributor.author |
Kiyamov Ayrat Gazinurovich |
ru_RU |
dc.contributor.author |
Nikitin Sergey Ivanovich |
ru_RU |
dc.contributor.author |
Tagirov Lenar Rafgatovich |
ru_RU |
dc.contributor.author |
Kharincev Sergey Sergeevich |
ru_RU |
dc.contributor.author |
Yusupov Roman Valerevich |
ru_RU |
dc.contributor.author |
Yanilkin Igor Vitalevich |
ru_RU |
dc.date.accessioned |
2017-01-01T00:00:00Z |
ru_RU |
dc.date.available |
2017-01-01T00:00:00Z |
ru_RU |
dc.date.issued |
2017 |
ru_RU |
dc.identifier.citation |
Mohammed W. M. et al. Electrical properties of titanium nitride films synthesized by reactive magnetron sputtering //Journal of Physics: Conference Series. – IOP Publishing, 2017. – Т. 927. – №. 1. – С. 012036. |
ru_RU |
dc.identifier.uri |
https://repository.kpfu.ru/eng/?p_id=173295&p_lang=2 |
ru_RU |
dc.description.abstract |
Journal of Physics: Conference Series |
ru_RU |
dc.description.abstract |
Reactive dc magnetron sputtering was employed to produce thin films of titanium nitride using titanium metallic target, argon as the plasma gas and nitrogen as the reactive gas. A set of the films was studied deposited on the Si, fused silica and crystalline (001) MgO substrates with various deposition conditions. The films deposited on the Si and SiO2 substrates are polycrystalline while deposited at slow rate to the heated to 600C MgO substrate are highly epitaxial according both to XRD and LEED data. Electrical resistivity of the films was measured by means of the four-probe van der Pauw method. |
ru_RU |
dc.language.iso |
ru |
ru_RU |
dc.subject |
Deposition conditions |
ru_RU |
dc.subject |
metallic targets |
ru_RU |
dc.subject |
MgO substrate |
ru_RU |
dc.subject |
polycrystalline |
ru_RU |
dc.subject |
reactive DC magnetron sputtering |
ru_RU |
dc.subject |
reactive magnetron sputtering |
ru_RU |
dc.subject |
titanium nitride films |
ru_RU |
dc.subject |
Van der Pauw method |
ru_RU |
dc.title |
Electrical properties of titanium nitride films synthesized by reactive magnetron sputtering |
ru_RU |
dc.type |
Articles in Russian journals and collections |
ru_RU |
|