Form of presentation | Articles in international journals and collections |
Year of publication | 2010 |
|
Gumarov Amir Ildusovich, author
Osin Yuriy Nikolaevich, author
Khaybullin Rustam Ildusovich, author
|
Bibliographic description in the original language |
Okay C. Optical and magnetic properties of Ni-implanted and post-annealed ZnO thin films [Text] / C. Okay, B.Z. Rameev, S. Güler, R.I. Khaibullin,"R.R. Khakimova, Y.N. Osin, N. Akdoğan, A.I. Gumarov, A. Nefedov, H. Zabel, B. Aktaş // Applied Physics A.. 2010. V. 104, No 2. P. 667-675. |
Annotation |
Single-crystalline ZnO thin films have been
grown on sapphire substrates and implanted by 40 keV
Ni+ ions with a dose of 0.25-1.25 × 10^17 ions/cm2. After
implantation the samples have been annealed at T = 1000?C
for 30 minutes in air. Both as-prepared and annealed nickelimplanted
ZnO samples have been investigated by ferromagnetic
resonance (FMR), vibrating sample magnetometry
(VSM), scanning electron microscopy (SEM), and optical
techniques. SEM studies reveal that the surface of
non-implanted ZnO thin film is very smooth, while microcracks
are present in the Ni-implanted ZnO samples. Annealing
after implantation recovers the surface of the implanted
ZnO... |
Keywords |
Ion implantation, Magnetism, Optical, ZnO, thin film, Ni-ions, |
URL |
http://link.springer.com/article/10.1007%2Fs00339-011-6314-3 |
Please use this ID to quote from or refer to the card |
https://repository.kpfu.ru/eng/?p_id=71837&p_lang=2 |
Full metadata record |
Field DC |
Value |
Language |
dc.contributor.author |
Gumarov Amir Ildusovich |
ru_RU |
dc.contributor.author |
Osin Yuriy Nikolaevich |
ru_RU |
dc.contributor.author |
Khaybullin Rustam Ildusovich |
ru_RU |
dc.date.accessioned |
2010-01-01T00:00:00Z |
ru_RU |
dc.date.available |
2010-01-01T00:00:00Z |
ru_RU |
dc.date.issued |
2010 |
ru_RU |
dc.identifier.citation |
Okay C. Optical and magnetic properties of Ni-implanted and post-annealed ZnO thin films [Text] / C. Okay, B.Z. Rameev, S. Güler, R.I. Khaibullin,"R.R. Khakimova, Y.N. Osin, N. Akdoğan, A.I. Gumarov, A. Nefedov, H. Zabel, B. Aktaş // Applied Physics A.. 2010. V. 104, No 2. P. 667-675. |
ru_RU |
dc.identifier.uri |
https://repository.kpfu.ru/eng/?p_id=71837&p_lang=2 |
ru_RU |
dc.description.abstract |
Single-crystalline ZnO thin films have been
grown on sapphire substrates and implanted by 40 keV
Ni+ ions with a dose of 0.25-1.25 × 10^17 ions/cm2. After
implantation the samples have been annealed at T = 1000?C
for 30 minutes in air. Both as-prepared and annealed nickelimplanted
ZnO samples have been investigated by ferromagnetic
resonance (FMR), vibrating sample magnetometry
(VSM), scanning electron microscopy (SEM), and optical
techniques. SEM studies reveal that the surface of
non-implanted ZnO thin film is very smooth, while microcracks
are present in the Ni-implanted ZnO samples. Annealing
after implantation recovers the surface of the implanted
ZnO... |
ru_RU |
dc.language.iso |
ru |
ru_RU |
dc.subject |
Ion implantation |
ru_RU |
dc.subject |
Magnetism |
ru_RU |
dc.subject |
Optical |
ru_RU |
dc.subject |
ZnO |
ru_RU |
dc.subject |
thin film |
ru_RU |
dc.subject |
Ni-ions |
ru_RU |
dc.subject |
|
ru_RU |
dc.title |
Optical and magnetic properties of Ni-implanted and post-annealed ZnO thin films |
ru_RU |
dc.type |
Articles in international journals and collections |
ru_RU |
|